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Closes today
Netherlands – Microelectronic machinery and apparatus and microsystems – Metrology SEM+FIB system
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO · Electrical machinery · Netherlands
Buyer
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Value
€1,300,000
Deadline
Closes in 34 days (7 Sept 2026)
Published
28 July 2026
Sector
Electrical machinery
Where
Netherlands
What the buyer wants
The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem
Also open in this sector
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Closes today
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Closes today
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Closes today
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